| Upset hardened memory design for submicron CMOS technology T Calin, M Nicolaidis, R Velazco IEEE Transactions on nuclear science 43 (6), 2874-2878, 1996 | 1542 | 1996 |
| A survey on fault injection techniques H Ziade, RA Ayoubi, R Velazco Int. Arab J. Inf. Technol. 1 (2), 171-186, 2004 | 396 | 2004 |
| Radiation effects on embedded systems R Velazco, P Fouillat, R Reis Springer Science & Business Media, 2007 | 198 | 2007 |
| Predicting error rate for microprocessor-based digital architectures through CEU (Code Emulating Upsets) injection R Velazco, S Rezgui, R Ecoffet IEEE Transactions on Nuclear Science 47 (6), 2405-2411, 2000 | 181 | 2000 |
| Experimentally evaluating an automatic approach for generating safety-critical software with respect to transient errors P Cheynet, B Nicolescu, R Velazco, M Rebaudengo, MS Reorda, ... IEEE Transactions on Nuclear Science 47 (6), 2231-2236, 2000 | 150 | 2000 |
| Two CMOS memory cells suitable for the design of SEU-tolerant VLSI circuits R Velazco, D Bessot, S Duzellier, R Ecoffet, R Koga IEEE Transactions on Nuclear Science 41 (6), 2229-2234, 1994 | 131 | 1994 |
| Detecting soft errors by a purely software approach: method, tools and experimental results B Nicolescu, R Velazco Embedded Software for SoC, 39-51, 2003 | 123 | 2003 |
| Design of SEU-hardened CMOS memory cells: the HIT cell D Bessot, R Velazco RADECS 93. Second European Conference on Radiation and its Effects on …, 1993 | 117 | 1993 |
| Software detection mechanisms providing full coverage against single bit-flip faults B Nicolescu, Y Savaria, R Velazco IEEE Transactions on Nuclear science 51 (6), 3510-3518, 2004 | 90 | 2004 |
| An automated SEU fault-injection method and tool for HDL-based designs W Mansour, R Velazco IEEE Transactions on Nuclear Science 60 (4), 2728-2733, 2013 | 83 | 2013 |
| Assessing contact graph routing performance and reliability in distributed satellite constellations JA Fraire, P Madoery, S Burleigh, M Feldmann, J Finochietto, A Charif, ... Journal of Computer Networks and Communications 2017 (1), 2830542, 2017 | 78 | 2017 |
| Deep submicron CMOS technologies for the LHC experiments P Jarron, G Anelli, T Calin, J Cosculluela, M Campbell, M Delmastro, ... Nuclear Physics B-Proceedings Supplements 78 (1-3), 625-634, 1999 | 78 | 1999 |
| Single event effects in static and dynamic registers in a 0.25/spl mu/m CMOS technology F Faccio, K Kloukinas, A Marchioro, T Calin, J Cosculluela, M Nicolaidis, ... IEEE Transactions on Nuclear Science 46 (6), 1434-1439, 1999 | 75 | 1999 |
| Total dose and single event effects (SEE) in a CMOS technology F Faccio, R Velazco, T Calin, A Marchioro, KC Kloukinas, W Snoeys, ... | 71 | 1999 |
| SEU-hardened storage cell validation using a pulsed laser R Velazco, T Calin, M Nicolaidis, SC Moss, SD LaLumondiere, VT Tran, ... IEEE Transactions on Nuclear Science 43 (6), 2843-2848, 1996 | 68 | 1996 |
| SEU induced errors observed in microprocessor systems V Asenek, C Underwood, R Velazco, S Rezgui, M Oldfield, P Cheynet, ... IEEE Transactions on Nuclear Science 45 (6), 2876-2883, 1998 | 59 | 1998 |
| THESIC: A testbed suitable for the qualification of integrated circuits devoted to operate in harsh environment R Velazco, P Cheynet, A Bofill, R Ecoffet IEEE European Test Workshop (ETW'98), 1998 | 58 | 1998 |
| Estimating error rates in processor-based architectures S Rezgui, R Velazco, R Ecoffet, S Rodriguez, JR Mingo IEEE Transactions on Nuclear Science 48 (5), 1680-1687, 2001 | 55 | 2001 |
| Bit flip injection in processor-based architectures: a case study GC Cardarilli, F Kaddour, A Leandri, M Ottavi, S Pontarelli, R Velazco Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW …, 2002 | 54 | 2002 |
| Heavy ion test results for the 68020 microprocessor and the 68882 coprocessor R Velazco, S Karoui, T Chapuis, D Benezech, LH Rosier IEEE Transactions on Nuclear Science 39 (3), 436-440, 1992 | 54 | 1992 |
