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Co-authors
- Kwyro LeeProfessor of Electrical Engineering, KAISTVerified email at kaist.ac.kr
- Kwangseok HanSenior director, MACOMVerified email at macom.com
- Minkyu JeAssociate Professor, School of Electrical Engineering, KAISTVerified email at kaist.ac.kr
- Kwang-Seok YunSogang UniversityVerified email at sogang.ac.kr
- Hong-Jeong KimSamsung SDIVerified email at samsung.com
- Euisik YoonUniversity of MichiganVerified email at umich.edu
- Ilku NamProfessor of Electrical Engineering, Pusan National UniversityVerified email at pusan.ac.kr
- Chester Sungchung ParkKonkuk UniversityVerified email at konkuk.ac.kr
- Minsuk KooUniversity of SeoulVerified email at uos.ac.kr
- chulhyun parkVerified email at kau.kr
- choong ki kimProfessor of Electrical Engineering, KAISTVerified email at kaist.ac.kr
- Myounggon KangUniversity of Seoul, School of Advanced Fusion StudiesVerified email at uos.ac.kr
- Jong-Ho LeeDepartment of Electrical and Computer Engineering, Seoul National UniversityVerified email at snu.ac.kr
- Ramesh HarjaniE. F. Johnson Professor, Electrical & Computer Engineering, University of MinnesotaVerified email at umn.edu
- Taehyoun OhAssociate Professor of Electrical Engineering, Kwangwoon UniversityVerified email at kw.ac.kr
- Soon-Jae KweonAssistant Professor, School of Information, Communications and EE, The Catholic University of KoreaVerified email at catholic.ac.kr