prof. Andrea Irace

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Soavtorji

Giovanni BreglioUniversità di Napoli Federico IIPreverjeni e-poštni naslov na unina.it
Riccio MicheleUniversity of Naples Federico II - Department of Electrical Engineering and Information technologiesPreverjeni e-poštni naslov na unina.it
Luca MarescaUniversity of Naples Federico II - Department of Electrical Engineering and Information technologiesPreverjeni e-poštni naslov na unina.it
Gianpaolo Romano, PhDPrincipal R&D Engineer, StarPower Europe, SwitzerlandPreverjeni e-poštni naslov na starpowereurope.com
Vincenzo d'AlessandroFull Professor of Electronics, DIETI, University Federico II, Naples, ItalyPreverjeni e-poštni naslov na unina.it
Mario IodiceISASI - CNRPreverjeni e-poštni naslov na cnr.it
Giuseppe CoppolaInstitute of Applied Science and Intelligent SystemsPreverjeni e-poštni naslov na cnr.it
Giuseppe De FalcoPh.D., University of Naples "Federico II"- DIETIPreverjeni e-poštni naslov na unina.it
Daliento SantoloProfessore di Dispositivi e Sistemi Fotovoltaici, Università di NapoliPreverjeni e-poštni naslov na unina.it
P.M. (Lina) SarroDelft University of Technology, The NetherlandsPreverjeni e-poštni naslov na tudelft.nl
ettore napoliUniversity of SalernoPreverjeni e-poštni naslov na unina.it
michele giordanoResearcher Institute Polymers Composites and Biomaterials CNRPreverjeni e-poštni naslov na cnr.it
Lorenzo CodecasaProfessor of Electric Engineering, Politecnico di MilanoPreverjeni e-poštni naslov na polimi.it
Antonio Pio CatalanoAssistant Professor in Electronic Engineering for University of Naples Federico IIPreverjeni e-poštni naslov na unina.it
Alessandro MagnaniSemi ZabalaPreverjeni e-poštni naslov na semizabala.com
Nicholas WrightProfessor of Electronic Materials, Newcastle UniversityPreverjeni e-poštni naslov na ncl.ac.uk
Paolo MironeUniversity of Naples "Federico II"Preverjeni e-poštni naslov na unina.it
Salvatore StranoRicercatore, Dipartimento di Ingegneria Industriale, Università degli Studi di Napoli Federico IIPreverjeni e-poštni naslov na unina.it
Helmut KöckInfineon TechnologiesPreverjeni e-poštni naslov na infineon.com
Stefania CampopianoProfessor of ElectronicsPreverjeni e-poštni naslov na uniparthenope.it

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prof. Andrea Irace

University of Naples Federico II

Preverjeni e-poštni naslov na unina.it

SiC power semiconductor devices optoelectronic devices Wide Bandgap Materials Wide Bandgap Devices


Naslov Razvrsti po navedbah Razvrsti po letniku Razvrsti po naslovu	Navedeno Navedeno	Leto
A comprehensive study of short-circuit ruggedness of silicon carbide power MOSFETs G Romano, A Fayyaz, M Riccio, L Maresca, G Breglio, A Castellazzi, ... IEEE Journal of Emerging and Selected Topics in Power Electronics 4 (3), 978-987, 2016	259	2016
SiC power MOSFETs performance, robustness and technology maturity A Castellazzi, A Fayyaz, G Romano, L Yang, M Riccio, A Irace Microelectronics Reliability 58, 164-176, 2016	136	2016
All-silicon optical temperature sensor based on Multi-Mode Interference A Irace, G Breglio Optics express 11 (22), 2807-2812, 2003	114	2003
Short-circuit failure mechanism of SiC power MOSFETs G Romano, L Maresca, M Riccio, V d'Alessandro, G Breglio, A Irace, ... 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's …, 2015	101	2015
An electrically controlled Bragg reflector integrated in a rib silicon on insulator waveguide A Cutolo, M Iodice, A Irace, P Spirito, L Zeni Applied physics letters 71 (2), 199-201, 1997	101	1997
Circuit-based electrothermal simulation of power devices by an ultrafast nonlinear MOR approach L Codecasa, V d’Alessandro, A Magnani, A Irace IEEE Transactions on Power Electronics 31 (8), 5906-5916, 2015	80	2015
Short-circuit robustness of SiC power MOSFETs: Experimental analysis A Castellazzi, A Fayyaz, L Yang, M Riccio, A Irace 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's …, 2014	80	2014
Experimental detection and numerical validation of different failure mechanisms in IGBTs during unclamped inductive switching G Breglio, A Irace, E Napoli, M Riccio, P Spirito IEEE Transactions on Electron Devices 60 (2), 563-570, 2012	78	2012
A temperature-dependent SPICE model of SiC power MOSFETs for within and out-of-SOA simulations M Riccio, V d'Alessandro, G Romano, L Maresca, G Breglio, A Irace IEEE Transactions on power electronics 33 (9), 8020-8029, 2017	77	2017
Experimental analysis of electro-thermal instability in SiC Power MOSFETs M Riccio, A Castellazzi, G De Falco, A Irace Microelectronics Reliability 53 (9-11), 1739-1744, 2013	67	2013
Fiber optic humidity sensors for high-energy physics applications at CERN M Consales, A Buosciolo, A Cutolo, G Breglio, A Irace, S Buontempo, ... Sensors and Actuators B: Chemical 159 (1), 66-74, 2011	66	2011
Measurement of thermal conductivity and diffusivity of single and multilayer membranes A Irace, PM Sarro Sensors and Actuators A: Physical 76 (1-3), 323-328, 1999	65	1999
UIS failure mechanism of SiC power MOSFETs A Fayyaz, A Castellazzi, G Romano, M Riccio, A Irace, J Urresti, N Wright 2016 IEEE 4th Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2016	60	2016
All-silicon optoelectronic modulator with 1 GHz switching capability A Irace, G Breglio, A Cutolo Electronics Letters 39 (2), 1, 2003	58	2003
Statistical analysis of the electrothermal imbalances of mismatched parallel SiC power MOSFETs A Borghese, M Riccio, A Fayyaz, A Castellazzi, L Maresca, G Breglio, ... IEEE Journal of Emerging and Selected Topics in Power Electronics 7 (3 …, 2019	53	2019
SPICE modeling and dynamic electrothermal simulation of SiC power MOSFETs V d'Alessandro, A Magnani, M Riccio, G Breglio, A Irace, N Rinaldi, ... 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's …, 2014	52	2014
A comprehensive study on the avalanche breakdown robustness of silicon carbide power MOSFETs A Fayyaz, G Romano, J Urresti, M Riccio, A Castellazzi, A Irace, N Wright Energies 10 (4), 452, 2017	49	2017
Single pulse avalanche robustness and repetitive stress ageing of SiC power MOSFETs A Fayyaz, L Yang, M Riccio, A Castellazzi, A Irace Microelectronics Reliability 54 (9-10), 2185-2190, 2014	45	2014
Electro-thermal instability in multi-cellular Trench-IGBTs in avalanche condition: Experiments and simulations M Riccio, A Irace, G Breglio, P Spirito, E Napoli, Y Mizuno 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and …, 2011	45	2011
Optical measurement techniques of recombination lifetime based on the free carriers absorption effect M De Laurentis, A Irace Journal of solid state physics 2014 (1), 291469, 2014	44	2014

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