Signature of Superfluid Density in the Single-Particle Excitation Spectrum of Bi2Sr2CaCu2O8+δ DL Feng, DH Lu, KM Shen, C Kim, H Eisaki, A Damascelli, R Yoshizaki, ... Science 289 (5477), 277-281, 2000 | 339 | 2000 |
Magnetoelastic coupling and magnetic anisotropy in films J O’Donnell, MS Rzchowski, JN Eckstein, I Bozovic Applied Physics Letters 72 (14), 1775-1777, 1998 | 176 | 1998 |
Anisotropic magnetoresistance in tetragonal La1−xCaxMnOδ thin films JN Eckstein, I Bozovic, J O’Donnell, M Onellion, MS Rzchowski Applied physics letters 69 (9), 1312-1314, 1996 | 151 | 1996 |
MRAM as embedded non-volatile memory solution for 22FFL FinFET technology O Golonzka, JG Alzate, U Arslan, M Bohr, P Bai, J Brockman, B Buford, ... 2018 IEEE International Electron Devices Meeting (IEDM), 18.1. 1-18.1. 4, 2018 | 143 | 2018 |
Nodal Quasiparticle Lifetime in the Superconducting State of J Corson, J Orenstein, S Oh, J O'Donnell, JN Eckstein Physical review letters 85 (12), 2569, 2000 | 141 | 2000 |
Mesoscopic thermodynamics of an inhomogeneous colossal-magnetoresistive phase RD Merithew, MB Weissman, FM Hess, P Spradling, ER Nowak, ... Physical review letters 84 (15), 3442, 2000 | 125 | 2000 |
Magnetoresistance scaling in MBE-grown Mn thin films J O'donnell, M Onellion, MS Rzchowski, JN Eckstein, I Bozovic Physical Review B 54 (10), R6841, 1996 | 125 | 1996 |
13.3 a 7mb stt-mram in 22ffl finfet technology with 4ns read sensing time at 0.9 v using write-verify-write scheme and offset-cancellation sensing technique L Wei, JG Alzate, U Arslan, J Brockman, N Das, K Fischer, T Ghani, ... 2019 IEEE International Solid-State Circuits Conference-(ISSCC), 214-216, 2019 | 123 | 2019 |
Colossal magnetoresistance magnetic tunnel junctions grown by molecular-beam epitaxy J O’donnell, AE Andrus, S Oh, EV Colla, JN Eckstein Applied Physics Letters 76 (14), 1914-1916, 2000 | 114 | 2000 |
Low-field magnetoresistance in tetragonal sfilms J O'Donnell, M Onellion, MS Rzchowski, JN Eckstein, I Bozovic Physical Review B 55 (9), 5873, 1997 | 94 | 1997 |
Temperature and magnetic field dependent transport anisotropies in films J O’Donnell, JN Eckstein, MS Rzchowski Applied Physics Letters 76 (2), 218-220, 2000 | 89 | 2000 |
Non-volatile RRAM embedded into 22FFL FinFET technology O Golonzka, U Arslan, P Bai, M Bohr, O Baykan, Y Chang, A Chaudhari, ... 2019 Symposium on VLSI Technology, T230-T231, 2019 | 59 | 2019 |
Anisotropic properties of molecular beam epitaxy-grown colossal magnetoresistance manganite thin films J O’Donnell, M Onellion, MS Rzchowski, I Eckstein, J. N., Bozovic Journal of Applied Physics 81 (8), 4961-4963, 1997 | 32 | 1997 |
Characterization of SILC and its end-of-life reliability assessment on 45NM high-K and metal-gate technology S Pae, T Ghani, M Hattendorf, J Hicks, J Jopling, J Maiz, K Mistry, ... 2009 IEEE International Reliability Physics Symposium, 499-504, 2009 | 18 | 2009 |
eNVM RRAM reliability performance and modeling in 22FFL FinFET technology YF Chang, JA O'Donnell, T Acosta, R Kotlyar, A Chen, PA Quintero, ... 2020 IEEE International Reliability Physics Symposium (IRPS), 1-4, 2020 | 10 | 2020 |
On the similarity of the spectral weight pattern of Bi2Sr2CaCuO8+ δ and La1. 48Nd0. 4Sr0. 12CuO4 DL Feng, DH Lu, KM Shen, S Oh, A Andrus, J O'Donnell, JN Eckstein, ... Physica C: Superconductivity 341, 2097-2098, 2000 | 8 | 2000 |
Rheed Studies of a-Axis Oriented DyBa2Cu3O7 Films Grown by All-MBE I Bozovic, JN Eckstein, N Bozovic, J O'Donnell MRS Online Proceedings Library (OPL) 502, 1997 | 8 | 1997 |
Embedded emerging memory technologies for neuromorphic computing: Temperature instability and reliability YF Chang, I Karpov, R Hopkins, D Janosky, J Medeiros, B Sherrill, ... 2021 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2021 | 7 | 2021 |
eNVM MRAM retention reliability modeling in 22FFL FinFET technology JA O'Donnell, C Connor, T Pramanik, J Hicks, JG Alzate, F Hamzaoglu, ... 2019 IEEE International Reliability Physics Symposium (IRPS), 1-3, 2019 | 5 | 2019 |
Defect scattering in high Tc and colossal magnetoresistive tunnel junctions JN Eckstein, J O'Donnell, S Oh, AE Andrus, M Warusawathana, E Bertram, ... Physica C: Superconductivity 335 (1-4), 184-189, 2000 | 5 | 2000 |