Follow
Christopher R Ryder
Christopher R Ryder
Booz Allen Hamilton
Verified email at u.northwestern.edu
Title
Cited by
Cited by
Year
Covalent functionalization and passivation of exfoliated black phosphorus via aryl diazonium chemistry
CR Ryder, JD Wood, SA Wells, Y Yang, D Jariwala, TJ Marks, GC Schatz, ...
Nature Chemistry, 2016
8022016
Chemically Tailoring Semiconducting Two-Dimensional Transition Metal Dichalcogenides and Black Phosphorus
CR Ryder, JD Wood, SA Wells, MC Hersam
ACS nano 10 (4), 3900-3917, 2016
2852016
Anisotropic Thermal Conductivity of Exfoliated Black Phosphorus
H Jang, JD Wood, CR Ryder, MC Hersam, DG Cahill
Advanced Materials 27 (48), 8017-8022, 2015
2842015
Stable aqueous dispersions of optically and electronically active phosphorene
J Kang, SA Wells, JD Wood, JH Lee, X Liu, CR Ryder, J Zhu, JR Guest, ...
Proceedings of the National Academy of Sciences 113 (42), 11688-11693, 2016
2602016
Probing Out-of-Plane Charge Transport in Black Phosphorus with Graphene-Contacted Vertical Field-Effect Transistors
J Kang, D Jariwala, CR Ryder, SA Wells, Y Choi, E Hwang, JH Cho, ...
Nano letters 16 (4), 2580-2585, 2016
1392016
3D Anisotropic Thermal Conductivity of Exfoliated Rhenium Disulfide
H Jang, CR Ryder, JD Wood, MC Hersam, DG Cahill
Advanced Materials 29 (35), 2017
1092017
Resolving the In‐Plane Anisotropic Properties of Black Phosphorus
X Liu, CR Ryder, SA Wells, MC Hersam
Small Methods, 2017
1072017
Rapid and Large-Area Characterization of Exfoliated Black Phosphorus Using Third-Harmonic Generation Microscopy
A Autere, CR Ryder, A Säynätjoki, L Karvonen, B Amirsolaimani, ...
The Journal of Physical Chemistry Letters 8 (7), 1343-1350, 2017
972017
Metal oxide nanoparticle growth on graphene via chemical activation with atomic oxygen
JE Johns, JMP Alaboson, S Patwardhan, CR Ryder, GC Schatz, ...
Journal of the American Chemical Society 135 (48), 18121-18125, 2013
382013
All-Electrical Determination of Crystal Orientation in Anisotropic Two-Dimensional Materials
L Peng, SA Wells, CR Ryder, MC Hersam, M Grayson
Physical Review Letters 120 (8), 086801, 2018
232018
Reliability Characteristics of a High Density Metal-Insulator-Metal Capacitor on Intel’s 10+ Process
CY Lin, UE Avci, MA Blount, R Grover, J Hicks, R Kasim, A Kundu, ...
2020 IEEE International Reliability Physics Symposium (IRPS), 1-4, 2020
122020
The system can't perform the operation now. Try again later.
Articles 1–11