Spremljaj
Jacques Klein
Naslov
Navedeno
Navedeno
Leto
Flowdroid: Precise context, flow, field, object-sensitive and lifecycle-aware taint analysis for android apps
S Arzt, S Rasthofer, C Fritz, E Bodden, A Bartel, J Klein, Y Le Traon, ...
PLDI: Acm Sigplan Notices 49 (6), 259-269, 2014
27502014
Androzoo: Collecting millions of android apps for the research community
K Allix, TF Bissyandé, J Klein, Y Le Traon
MSR: 2016 IEEE/ACM 13th Working Conference on Mining Software Repositories …, 2016
10872016
Iccta: Detecting inter-component privacy leaks in android apps
L Li, A Bartel, TF Bissyandé, J Klein, Y Le Traon, S Arzt, S Rasthofer, ...
ICSE: Proceedings of the 37th International Conference on Software …, 2015
8062015
Effective inter-component communication mapping in Android with Epicc: an essential step towards holistic security analysis
D Octeau, P McDaniel, S Jha, A Bartel, E Bodden, J Klein, Y Le Traon
Usenix Security: Presented as part of the 22nd {USENIX} Security Symposium …, 2013
579*2013
Static analysis of android apps: A systematic literature review
L Li, TF Bissyandé, M Papadakis, S Rasthofer, A Bartel, D Octeau, J Klein, ...
IST: Information and Software Technology 88, 67-95, 2017
4482017
Dexpler: converting android dalvik bytecode to jimple for static analysis with soot
A Bartel, J Klein, Y Le Traon, M Monperrus
Proceedings of the ACM SIGPLAN International Workshop on State of the Art in …, 2012
3302012
Automated and scalable t-wise test case generation strategies for software product lines
G Perrouin, S Sen, J Klein, B Baudry, Y Le Traon
ICST: Software Testing, Verification and Validation (ICST), 2010 Third …, 2010
3132010
Fixminer: Mining relevant fix patterns for automated program repair
A Koyuncu, K Liu, TF Bissyandé, D Kim, J Klein, M Monperrus, Y Le Traon
EMSE: Empirical Software Engineering, 1-45, 2020
2582020
Bypassing the combinatorial explosion: Using similarity to generate and prioritize t-wise test configurations for software product lines
C Henard, M Papadakis, G Perrouin, J Klein, P Heymans, Y Le Traon
TSE: IEEE Transactions on Software Engineering 40 (7), 650-670, 2014
2572014
Automated testing of android apps: A systematic literature review
P Kong, L Li, J Gao, K Liu, TF Bissyandé, J Klein
IEEE Transactions on Reliability 68 (1), 45-66, 2018
2492018
Is ChatGPT the ultimate programming assistant--how far is it?
H Tian, W Lu, TO Li, X Tang, SC Cheung, J Klein, TF Bissyandé
arXiv preprint arXiv:2304.11938, 2023
2402023
Got issues? who cares about it? a large scale investigation of issue trackers from github
TF Bissyandé, D Lo, L Jiang, L Réveillere, J Klein, Y Le Traon
ISSRE: 2013 IEEE 24th international symposium on software reliability …, 2013
2262013
Understanding android app piggybacking: A systematic study of malicious code grafting
L Li, D Li, TF Bissyandé, J Klein, Y Le Traon, D Lo, L Cavallaro
TIFS: IEEE Transactions on Information Forensics and Security 12 (6), 1269-1284, 2017
2092017
Automatically securing permission-based software by reducing the attack surface: An application to android
A Bartel, J Klein, Y Le Traon, M Monperrus
ASE: Proceedings of the 27th IEEE/ACM International Conference on Automated …, 2012
2042012
Pairwise testing for software product lines: comparison of two approaches
G Perrouin, S Oster, S Sen, J Klein, B Baudry, Y Le Traon
SQJ: Software Quality Journal 20 (3-4), 605-643, 2012
1992012
Aspect-oriented multi-view modeling
J Kienzle, W Al Abed, J Klein
AOSD: Proceedings of the 8th ACM international conference on Aspect-oriented …, 2009
1922009
Droidra: Taming reflection to support whole-program analysis of android apps
L Li, TF Bissyandé, D Octeau, J Klein
ISSTA: Proceedings of the 25th International Symposium on Software Testing …, 2016
1902016
You cannot fix what you cannot find! an investigation of fault localization bias in benchmarking automated program repair systems
K Liu, A Koyuncu, TF Bissyandé, D Kim, J Klein, Y Le Traon
ICST: 2019 12th IEEE Conference on Software Testing, Validation and …, 2019
1862019
On the Efficiency of Test Suite based Program Repair: A Systematic Assessment of 16 Automated Repair Systems for Java Programs
K Liu, S Wang, A Koyuncu, K Kim, TFDA Bissyande, D Kim, P Wu, J Klein, ...
ICSE: 42nd ACM/IEEE International Conference on Software Engineering (ICSE), 2020
1732020
Empirical assessment of machine learning-based malware detectors for Android
K Allix, TF Bissyandé, Q Jérome, J Klein, Y Le Traon
EMSE: Empirical Software Engineering 21 (1), 183-211, 2016
172*2016
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